International Intern from Germany

Mr. Benjamin Händel from Department of Experimental Physics, Ilmenau University of Technology, Germany has started a three month short-term research internship in ITRC since April 1. The research topic is Near-field Scanning Optical Microscope.

ITRC earned two golden medals in iENA 2009 held in Nuremberg, Germany.

ITRC's "Chip Defects Inspecting Device and Inspecting Method Thereof" and "Lens Measurement Device and Method for Measuring Lens" earned two golden medals in iENA 2009 held in Nuremberg, Germany.

On behalf of NARL, ITRC attended 2009 Taipei International Invention Show & Technomart where we won 2 gold and 1 bronze medals.

ITRC attended 2009 Taipei International Invention Show & Technomart from Sep. 24 to 27 by exhibiting 3 objects “Liquid lens module inspecting device,” “Light emitter inspection device and method,” and “Non-visible light beam profile inspector” for competition, and another 2 objects “Method and instrument for measuring decenter and tilt of lens by interferometer” and “Zooming device” for display.

The book "Advanced Nano-Scale Inspection Technology" is published

The book "Advanced Nano-Scale Inspection Technology" published by ITRC is now available. Consisting of 9 chapters in more than 600 pages, this book covers the various applications of nanotechnology and the methods to inspect the nanostructure characteristics of components and materials.(This book is written in Chinese)